Open AccessIonizing Radiation Sensitivity Analysis of the Structural Characteristic for the MOS Capacitors
Author(s) -
Yujin Hwang,
Seungmin Lee
Publication year - 2013
Publication title -
jeon-gi hakoe nonmunji/jeon'gi haghoe nonmunji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.174
H-Index - 11
eISSN - 2287-4364
pISSN - 1975-8359
DOI - 10.5370/kiee.2013.62.7.963
Subject(s) - capacitor , ionizing radiation , materials science , radiation , capacitance , optoelectronics , sensitivity (control systems) , irradiation , electronic circuit , electronic engineering , electrical engineering , voltage , engineering , optics , physics , electrode , quantum mechanics , nuclear physics