Open AccessA Study on the Failure Analysis and Representation Test Method of High Frequency Transformer for SMPS
Author(s) -
Hong-Woo Lim,
YoungJoo Lee,
Jihun Han
Publication year - 2011
Publication title -
the transactions of the korean institute of electrical engineers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.174
H-Index - 11
eISSN - 2287-4364
pISSN - 1975-8359
DOI - 10.5370/kiee.2011.60.4.766
Subject(s) - transformer , reliability engineering , engineering , electronic engineering , computer science , electrical engineering , voltage
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