Open AccessMethod to Prevent the Malfunction Caused by the Transformer Magnetizing Inrush Current using IEC 61850-based IEDs and Dynamic Performance Test using RTDS Test-bed
Author(s) -
Hae-Gweon Kang,
Un-Sig Song,
Jin-Ho Kim,
Se-Chang Kim,
Jong-Soo Park,
Jong-Eun Park
Publication year - 2014
Publication title -
journal of electrical engineering and technology/journal of electrical engineering and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.226
H-Index - 27
eISSN - 2093-7423
pISSN - 1975-0102
DOI - 10.5370/jeet.2014.9.3.1104
Subject(s) - iec 61850 , inrush current , transformer , test (biology) , reliability engineering , engineering , current transformer , electrical engineering , voltage , mechanical engineering , automation , paleontology , biology