Open AccessComparison of ECT Probes in Diagnosis of Defects
Author(s) -
Ho-Young Mun,
Chang-Eob Kim
Publication year - 2014
Publication title -
journal of electrical engineering and technology/journal of electrical engineering and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.226
H-Index - 27
eISSN - 2093-7423
pISSN - 1975-0102
DOI - 10.5370/jeet.2014.9.1.190
Subject(s) - electrical impedance , eddy current testing , finite element method , eddy current , voltage , acoustics , materials science , nuclear magnetic resonance , electrical engineering , physics , structural engineering , engineering