Open AccessAdvanced LDC Test Bed Using Energy Recovery Technique for HEVs
Author(s) -
Yun-Sung Kim,
Dong-Wook Jung,
Byoung-Kuk Lee
Publication year - 2013
Publication title -
journal of electrical engineering and technology/journal of electrical engineering and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.226
H-Index - 27
eISSN - 2093-7423
pISSN - 1975-0102
DOI - 10.5370/jeet.2013.8.4.911
Subject(s) - reliability (semiconductor) , power (physics) , test (biology) , automotive engineering , energy (signal processing) , engineering , test method , reliability engineering , simulation , mathematics , paleontology , statistics , physics , quantum mechanics , biology