Open AccessValue-based Distributed Generation Placements for Reliability Criteria Improvement
Author(s) -
Morteza Heidari,
Mahdi Banejad
Publication year - 2013
Publication title -
journal of electrical engineering and technology/journal of electrical engineering and technology
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.226
H-Index - 27
eISSN - 2093-7423
pISSN - 1975-0102
DOI - 10.5370/jeet.2013.8.2.223
Subject(s) - reliability engineering , reliability (semiconductor) , value (mathematics) , computer science , statistics , mathematics , engineering , physics , power (physics) , quantum mechanics