z-logo
open-access-imgOpen Access
Optical and Electronic Properties of SnO2Thin Films Fabricated Using the SILAR Method
Author(s) -
Jong Hyun Jang,
Haena Yim,
Yoon-Ho Cho,
Dong-Heon Kang,
JiWon Choi
Publication year - 2015
Publication title -
senseo haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2093-7563
pISSN - 1225-5475
DOI - 10.5369/jsst.2015.24.6.364
Subject(s) - thin film , materials science , electrical resistivity and conductivity , tin oxide , sheet resistance , transmittance , analytical chemistry (journal) , diffraction , tin , layer (electronics) , oxide , composite material , optoelectronics , nanotechnology , optics , chemistry , metallurgy , electrical engineering , physics , chromatography , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here