Open AccessBurn-in Models: Recent Issues, Developments and Future Topics
Author(s) -
Ji-Hwan Cha
Publication year - 2009
Publication title -
communications for statistical applications and methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.326
H-Index - 6
eISSN - 2383-4757
pISSN - 2287-7843
DOI - 10.5351/ckss.2009.16.5.871
Subject(s) - burn in , reliability (semiconductor) , computer science , reliability engineering , risk analysis (engineering) , operations research , engineering , medicine , power (physics) , physics , quantum mechanics
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