Open AccessV-mask Type Criterion for Identification of Outliers In Logistic Regression
Author(s) -
Bu-Yong Kim
Publication year - 2005
Publication title -
communications for statistical applications and methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.326
H-Index - 6
eISSN - 2383-4757
pISSN - 2287-7843
DOI - 10.5351/ckss.2005.12.3.625
Subject(s) - outlier , mathematics , leverage (statistics) , statistics , logistic regression , robust statistics , estimator , cluster analysis , robust regression , pattern recognition (psychology) , covariance , hierarchical clustering , regression , artificial intelligence , data mining , computer science