Comparison of I – V Methods for Determination of Ti/ p-Si Schottky Diode Parameters | Zendy

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Comparison of I – V Methods for Determination of Ti/ p-Si Schottky Diode Parameters

Author(s) -

Hatice ASIL UĞURLU

Publication year - 2022

Publication title -

yüzüncü yıl üniversitesi fen bilimleri enstitüsü dergisi/van yüzüncü yıl üniversitesi fen bilimleri enstitüsü dergisi

Language(s) - English

Resource type - Journals

eISSN - 2667-467X

pISSN - 1300-5413

DOI - 10.53433/yyufbed.1058643

Subject(s) - physics , analytical chemistry (journal) , chemistry , nuclear chemistry , chromatography

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