Open AccessDevelopment of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms
Author(s) -
Sung Bum Kang,
Myungsun Lee,
Heui Jae Pahk
Publication year - 2008
Publication title -
je-eo lobos siseutem haghoe nonmunji/jeeo robot siseutem hakoe nonmunji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.215
H-Index - 11
eISSN - 2233-4335
pISSN - 1976-5622
DOI - 10.5302/j.icros.2008.14.5.444
Subject(s) - liquid crystal display , automated optical inspection , process (computing) , automated x ray inspection , scan line , image processing , thin film transistor , artificial intelligence , computer vision , computer science , visual inspection , machine vision , image (mathematics) , engineering , materials science , grayscale , layer (electronics) , composite material , operating system