z-logo
open-access-imgOpen Access
Reliable characterization of organic dielectrics degraded by high electric field
Author(s) -
Djamila Abid,
Hocine Hadi,
Mohammed Benzohra,
B. Youssef
Publication year - 2019
Publication title -
indonesian journal of electrical engineering and informatics (ijeei)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.168
H-Index - 8
ISSN - 2089-3272
DOI - 10.52549/ijeei.v7i1.547
Subject(s) - dielectric , materials science , electric field , differential scanning calorimetry , characterization (materials science) , relaxation (psychology) , degradation (telecommunications) , optoelectronics , electronic engineering , nanotechnology , engineering , psychology , social psychology , physics , quantum mechanics , thermodynamics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom