Reliable characterization of organic dielectrics degraded by high electric field
Author(s) -
Djamila Abid,
Hocine Hadi,
Mohammed Benzohra,
B. Youssef
Publication year - 2019
Publication title -
indonesian journal of electrical engineering and informatics (ijeei)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.168
H-Index - 8
ISSN - 2089-3272
DOI - 10.52549/ijeei.v7i1.547
Subject(s) - dielectric , materials science , electric field , differential scanning calorimetry , characterization (materials science) , relaxation (psychology) , degradation (telecommunications) , optoelectronics , electronic engineering , nanotechnology , engineering , psychology , social psychology , physics , quantum mechanics , thermodynamics
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