Open AccessTowards a Neural Network based Reliability Prediction Model via Bugs and Changes
Author(s) -
Camelia Şerban,
Andreea Veșcan
Publication year - 2021
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5220/0010600703020309
Subject(s) - computer science , reliability (semiconductor) , artificial neural network , reliability engineering , software bug , artificial intelligence , operating system , software , engineering , power (physics) , physics , quantum mechanics