Open AccessA Cross-layer Monitoring Solution based on Quality Models
Author(s) -
Damianos Metallidis,
Chrysostomos Zeginis,
Kyriakos Kritikos,
Dimitris Plexousakis
Publication year - 2017
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5220/0006306305070514
Subject(s) - layer (electronics) , computer science , quality (philosophy) , materials science , composite material , epistemology , philosophy