Open AccessPlenary Talk 2 - From Sensors to Standards: How NIST on a Chip is Transforming International Metrology
Author(s) -
Barbara L. Goldstein
Publication year - 2021
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5162/smsi2021/pt2
Subject(s) - nist , metrology , chip , measurement uncertainty , computer science , telecommunications , optics , physics , quantum mechanics , natural language processing
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