Open AccessPlenary Talk 2 - From Sensors to Standards: How NIST on a Chip is Transforming International Metrology
Author(s) -
Brian D. Goldstein
Publication year - 2021
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5162/smsi2021/pt2
Subject(s) - nist , metrology , chip , computer science , measurement uncertainty , optics , telecommunications , physics , quantum mechanics , natural language processing