Open AccessP2.5 - Reliability and long-term stability of the mounted silicon for precision measurements
Author(s) -
Tino Frank,
A. Cyriax,
A. Grün,
M. Kermann,
Thomas Ortlepp
Publication year - 2017
Publication title -
proceedings sensor 2011
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5162/sensor2017/p2.5
Subject(s) - gauge factor , strain gauge , materials science , piezoresistive effect , silicon , resistor , foil method , thermal expansion , reliability (semiconductor) , thermal shock , composite material , strips , stress (linguistics) , gauge (firearms) , electrical engineering , optoelectronics , mechanical engineering , fabrication , engineering , metallurgy , power (physics) , physics , quantum mechanics , medicine , linguistics , alternative medicine , philosophy , pathology , voltage
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