Open AccessP2.5 - Reliability and long-term stability of the mounted silicon for precision measurements
Author(s) -
Tino Frank,
A. Cyriax,
A. Grün,
M. Kermann,
Thomas Ortlepp
Publication year - 2017
Publication title -
proceedings sensor 2017
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5162/sensor2017/p2.5
Subject(s) - term (time) , reliability (semiconductor) , stability (learning theory) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics , machine learning