Open AccessC7.2 - Novel Multi Parameter Sensor Approach for Interface Measurement
Author(s) -
H. Schroth,
St. Gorenflo
Publication year - 2011
Publication title -
proceedings sensor 2011
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.5162/sensor11/c7.2
Subject(s) - reflectometry , capacitance , dielectric , interface (matter) , computer science , reliability (semiconductor) , measure (data warehouse) , measurement uncertainty , calibration , signal (programming language) , system of measurement , time domain , process (computing) , electronic engineering , position (finance) , materials science , optoelectronics , physics , engineering , data mining , electrode , computer vision , maximum bubble pressure method , operating system , bubble , power (physics) , quantum mechanics , parallel computing , programming language , finance , astronomy , economics
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