Open AccessArea, Delay and Power Analysis of Built in Self Repair Using 2-D Redundancy
Author(s) -
Aman Kumar Sabnani,
Balwinder Singh
Publication year - 2015
Publication title -
international journal of vlsi design and communication systems
Language(s) - English
Resource type - Journals
eISSN - 0976-1357
pISSN - 0976-1527
DOI - 10.5121/vlsic.2015.6503
Subject(s) - power analysis , redundancy (engineering) , computer science , reliability engineering , environmental science , engineering , algorithm , cryptography