Open AccessCost Effective Test Methodology Using PMU for Automated Test Equipment Systems
Author(s) -
In-Seok Jung,
Yong-Bin Kim,
Kyung Ki Kim
Publication year - 2014
Publication title -
international journal of vlsi design and communication systems
Language(s) - English
Resource type - Journals
eISSN - 0976-1357
pISSN - 0976-1527
DOI - 10.5121/vlsic.2014.5102
Subject(s) - test (biology) , reliability engineering , computer science , test equipment , engineering , geology , paleontology
In this paper, test methodology using parametric measurement unit is proposed for Automated Test\udEquipment (ATE) systems using 600MHz Driver, Comparator, and Active load (DCL). ATE systems is a\udvery important means to reduce the device test cost, and the systems should be able to test several modes to\udcheck the performance characteristics of the device. The proposed methodology provides four different\udtypes of test operation for DC and AC analysis of the Device-Under-Test(DUT). Along with the proposed\udmethodology, the paper proposes ATE system integration methodology for cost effective ATE integration\udfor high speed test. The measured test results using the proposed method and system turned out to be well\udwithin the target specifications with high accuracie