Open AccessReliability and MTSF Evaluation of Parallel-Series Configuration using Weibull Failure
Author(s) -
Safeer Rahman O.C.,
Santhosh Kumar K
Publication year - 2017
Publication title -
international journal of computer applications
Language(s) - English
Resource type - Journals
ISSN - 0975-8887
DOI - 10.5120/ijca2017915069
Subject(s) - computer science , reliability engineering , weibull distribution , reliability (semiconductor) , series (stratigraphy) , statistics , mathematics , engineering , physics , quantum mechanics , biology , paleontology , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom