Open AccessA Hybrid Approach for Detection and Classification of the Defects on Printed Circuit Board
Author(s) -
Swagata Ray,
Joydeep Mukherjee
Publication year - 2015
Publication title -
international journal of computer applications
Language(s) - English
Resource type - Journals
ISSN - 0975-8887
DOI - 10.5120/21595-4691
Subject(s) - computer science , printed circuit board , artificial intelligence , pattern recognition (psychology) , operating system
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