
2k Factorial Experiments in Reliability Analysis for Weibull and log-normal Distributions
Author(s) -
Berna Yazıcı,
Beldine Omondi
Publication year - 2021
Publication title -
international journal of engineering and innovative research
Language(s) - English
Resource type - Journals
ISSN - 2687-2153
DOI - 10.47933/ijeir.826795
Subject(s) - weibull distribution , reliability (semiconductor) , reliability engineering , factorial experiment , fractional factorial design , statistics , factorial , accelerated life testing , design of experiments , mathematics , product (mathematics) , power (physics) , computer science , engineering , mathematical analysis , physics , geometry , quantum mechanics