Open AccessEffect of SiO2 Thickness Variation on Threshold Voltage and Trans-Conductance of TFT
Author(s) -
Archana Jain,
Lalit Kumar Lata,
Abhinandan Jain,
Prerna Jain
Publication year - 2021
Publication title -
skit research journal
Language(s) - English
Resource type - Journals
eISSN - 2454-9673
pISSN - 2278-2508
DOI - 10.47904/ijskit.11.2.2021.37-39
Subject(s) - thin film transistor , conductance , variation (astronomy) , threshold voltage , materials science , optoelectronics , electrical engineering , voltage , transistor , condensed matter physics , composite material , engineering , physics , layer (electronics) , astrophysics