Open AccessSimilarity Measures for Automatic Defect Detection on Patterned Textures
Author(s) -
V Asha,
P. Nagabhushan,
Nagappa U. Bhajantri
Publication year - 2012
Publication title -
international journal of image processing and vision sciences
Language(s) - English
Resource type - Journals
ISSN - 2278-1110
DOI - 10.47893/ijipvs.2012.1004
Subject(s) - jaccard index , similarity (geometry) , bhattacharyya distance , pattern recognition (psychology) , histogram , artificial intelligence , pearson product moment correlation coefficient , correlation coefficient , mathematics , computer science , similarity measure , euclidean distance , image (mathematics) , statistics