Open AccessIMPACT OF METAL SOURCE/DRAIN CONTACTS ON GE-ON INSULATOR (GEOI) MOSFETS
Author(s) -
Chandrima Mondal,
Abhijit Biswas
Publication year - 2014
Publication title -
international journal of electrical and electronics engineering
Language(s) - English
Resource type - Journals
ISSN - 2231-5284
DOI - 10.47893/ijeee.2014.1117
Subject(s) - transconductance , materials science , mosfet , work function , subthreshold slope , optoelectronics , subthreshold conduction , metal gate , electrical engineering , voltage , metal , transistor , engineering , gate oxide , metallurgy