Open AccessSoft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit
Author(s) -
Monalisa Mohanty,
Surya N. Patnaik
Publication year - 2013
Publication title -
international journal of computer and communication technology
Language(s) - English
Resource type - Journals
eISSN - 2231-0371
pISSN - 0975-7449
DOI - 10.47893/ijcct.2013.1167
Subject(s) - very large scale integration , computer science , particle swarm optimization , automatic test pattern generation , digital pattern generator , electronic circuit , generator (circuit theory) , sequence (biology) , genetic algorithm , algorithm , computer engineering , integrated circuit , engineering , embedded system , machine learning , electrical engineering , power (physics) , physics , quantum mechanics , biology , genetics , operating system
Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for structure optimization of a deterministic test pattern generator using genetic algorithm(GA).