Open AccessCharacterization of EUV and Soft X-ray emitted by plasma produced in a nanosecond laser field using AXUV Photo-Diode detector
Author(s) -
نادر مرشدیان,
امیرحسین فرهبد
Publication year - 2020
Publication title -
majallah-i pizhūhish-i fīzīk-i īrān
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.143
H-Index - 5
eISSN - 2345-3664
pISSN - 1682-6957
DOI - 10.47176/ijpr.19.4.15204
Subject(s) - extreme ultraviolet lithography , nanosecond , laser , diode , optics , materials science , optoelectronics , plasma , detector , characterization (materials science) , x ray , physics , nuclear physics