
A Study on Optical Waveguide Application of Lanthanum III Oxide (LA O ) Thin Film Prepared 2 3 by Sol-gel Method.
Author(s) -
A A Akombor,
M. D. Tyona,
J.S.A. Adelabu
Publication year - 2015
Publication title -
nigerian journals of pure and applied sciences (benue online)
Language(s) - English
Resource type - Journals
ISSN - 2705-3997
DOI - 10.46912/napas.16
Subject(s) - materials science , thin film , raman spectroscopy , waveguide , substrate (aquarium) , sol gel , nanocrystalline material , spectroscopy , crystallite , analytical chemistry (journal) , lanthanum , lanthanum oxide , wafer , oxide , optics , optoelectronics , nanotechnology , inorganic chemistry , chemistry , oceanography , physics , chromatography , quantum mechanics , geology , metallurgy
Optogeometric properties of La 2 O 3 (Lanthanum Oxide) thin films prepared by sol-gel technique have been investigated. Characterization was derived by M-line spectroscopy, X-ray diffractometry and waveguide Raman Spectroscopy. M-line spectroscopy measurements revealed a refractive index of 1.592±0.001 on Pyrex substrate for a wavelength of 543.4nm and thin film thickness of 850nm and 1.589±0.001 on silicon wafer and thickness of single layer is between 40 and 60nm. X-ray diffractrometry has shown that the film has monoclinic structure. Waveguide Raman Spectroscopy has revealed a mixture of La 2 O 3 and La 2 O 2 CO 3 (Lanthanum Oxide Carbonate) which are mainly nanocrystalline and polycrystalline respectively. The research has shown that the La 2 O 3 thin films produced can be used as a planar optical waveguide. The results obtained are comparable with the works of other scientists using different measurement techniques.