Open AccessAN APPLICATION OF MICROWAVES REFRACTION FOR INHOMOGENEOUS PLASMA DIAGNOSTIC
Author(s) -
Y.V. Siusko,
Yu. V. Kovtun
Publication year - 2021
Publication title -
problems of atomic science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.216
H-Index - 17
eISSN - 1562-6016
pISSN - 1682-9344
DOI - 10.46813/2021-131-163
Subject(s) - plasma , microwave , refraction , plasma parameters , electromagnetic electron wave , magnetic field , electron density , physics , plasma diagnostics , computational physics , electron , optics , atomic physics , nuclear physics , quantum mechanics
A brief review of the main microwave diagnostics methods of inhomogeneous plasma based on the refraction of microwaves is given. These methods make it possible to determine the plasma density distribution, the magnetic field distribution, the electron collision frequency, and the electron temperature profile. In addition, the determination of the average density of the peripheral plasma layers and the local inhomogeneities of the rotating plasma are also possible. The effect of refraction on the accuracy of determining the plasma parameters by using microwave methods for plasma diagnostics is considered.