Open AccessConstant Voltage Stress (CVS) and Hot Carrier Injection (HCI) Degradations of Vertical Double-date InGaAs TFETs for Bio Sensor Applications
Author(s) -
Ji-Min Baek,
Dae-Hyun Kim
Publication year - 2022
Publication title -
senseo haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2093-7563
pISSN - 1225-5475
DOI - 10.46670/jsst.2022.31.1.41
Subject(s) - constant voltage , optoelectronics , materials science , voltage , hot carrier injection , constant (computer programming) , stress (linguistics) , electrical engineering , physics , engineering , computer science , transistor , linguistics , philosophy , programming language