Open AccessReliability Test of Pd Nanogap-Based Hydrogen Sensors
Author(s) -
Seyoung Park,
Won-Kyung Kim,
Wooyoung Lee
Publication year - 2020
Publication title -
journal of sensor science and technology
Language(s) - English
Resource type - Journals
eISSN - 2093-7563
pISSN - 1225-5475
DOI - 10.46670/jsst.2020.29.6.399
Subject(s) - reliability (semiconductor) , reliability engineering , test (biology) , materials science , computer science , engineering , physics , geology , thermodynamics , paleontology , power (physics)
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