Open AccessReliability Test of Pd Nanogap-Based Hydrogen Sensors
Author(s) -
Seiyoung Park.,
Wonkyung Kim,
Wooyoung Lee
Publication year - 2020
Publication title -
senseo haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2093-7563
pISSN - 1225-5475
DOI - 10.46670/jsst.2020.29.6.399
Subject(s) - reliability (semiconductor) , reliability engineering , test (biology) , materials science , computer science , engineering , physics , geology , thermodynamics , paleontology , power (physics)