Open AccessCounterfeit Luxury Handbag Materials Image Classification using Deep learning and Local Binary Pattern
Author(s) -
Possarun Apipawinwongsa,
Yachai Limpiyakorn
Publication year - 2022
Publication title -
international journal of emerging technology and advanced engineering
Language(s) - English
Resource type - Journals
ISSN - 2250-2459
DOI - 10.46338/ijetae0922_05
Subject(s) - counterfeit , local binary patterns , artificial intelligence , convolutional neural network , computer science , reuse , deep learning , pattern recognition (psychology) , pixel , feature extraction , feature (linguistics) , process (computing) , image (mathematics) , machine learning , computer vision , engineering , geography , histogram , linguistics , philosophy , archaeology , operating system , waste management
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