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Vertical electron density profiles from digisonde ionograms. The average representative profile
Author(s) -
Xueqin Huang,
B. W. Reinisch
Publication year - 1996
Publication title -
annals of geophysics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.394
H-Index - 60
eISSN - 2037-416X
pISSN - 1593-5213
DOI - 10.4401/ag-4010
Subject(s) - boundary (topology) , geology , electron density , ionogram , geodesy , geophysics , electron , mathematics , mathematical analysis , physics , quantum mechanics
Profile calculations from ionograms using the Huang-Reinisch technique arrive at a set of boundary values and coefficients that describe the profile. From an ensemble of such sets an Average Representative Profile (ARP) is derived which is again expressed in terms of boundary values and coefficients

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