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Uso da Microscopia Eletrônica de Varredura em Solo Residual de Gnaisse
Author(s) -
Fábio Krueger da Silva,
Fernanda Simoni Schuch,
Cesar Godoi
Publication year - 2020
Publication title -
congresso brasileiro de mecânica dos solos e engenharia geotécnica
Language(s) - Portuguese
Resource type - Conference proceedings
DOI - 10.4322/cobramseg.2022.0428
Subject(s) - materials science , scanning electron microscope , composite material

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