Open AccessImmunity Characterization of FPGA I/Os for Fault-Tolerant Circuit Designs against EMI
Author(s) -
Van-Sang Nguyen,
Dam Minh Tung,
Joonho So,
J.-G. LEE
Publication year - 2019
Publication title -
advances in electrical and computer engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.254
H-Index - 23
eISSN - 1844-7600
pISSN - 1582-7445
DOI - 10.4316/aece.2019.02005
Subject(s) - emi , electromagnetic interference , field programmable gate array , fault (geology) , fault tolerance , voltage , computer science , electronic engineering , power (physics) , electrical engineering , electromagnetic compatibility , interference (communication) , engineering , embedded system , reliability engineering , physics , channel (broadcasting) , quantum mechanics , seismology , geology
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