Open AccessPrecision measurements with the total reflection x-ray fluorescence system in Dar es Salaam
Author(s) -
Yusuf I. A. Koleleni,
J. W. Kondoro
Publication year - 1999
Publication title -
sinet. an ethiopian journal of science/sinet
Language(s) - English
Resource type - Journals
eISSN - 2520-7997
pISSN - 0379-2897
DOI - 10.4314/sinet.v22i1.18139
Subject(s) - dar es salaam , reflection (computer programming) , x ray fluorescence , fluorescence , optics , geography , materials science , physics , tanzania , computer science , environmental planning , programming language