Structural and surface compositional characterization of silver thin films prepared by solution growth technique
Author(s) -
Adam Ahmed,
E.J. Ibanga
Publication year - 2007
Publication title -
deleted journal
Language(s) - English
Resource type - Journals
ISSN - 1595-0611
DOI - 10.4314/njphy.v18i2.38099
Subject(s) - x ray photoelectron spectroscopy , scanning electron microscope , materials science , thin film , lattice constant , diffraction , analytical chemistry (journal) , chemical bath deposition , chemical engineering , crystallography , nanotechnology , chemistry , optics , composite material , chromatography , physics , engineering
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