Open AccessAutomatic test pattern generation for iterative logic arrays
Author(s) -
Kwame Osei Boateng
Publication year - 2005
Publication title -
journal of the university of science and technology
Language(s) - Uncategorized
Resource type - Journals
ISSN - 0855-0395
DOI - 10.4314/just.v24i2.32911
Subject(s) - testability , automatic test pattern generation , fault coverage , computer science , fault (geology) , test (biology) , algorithm , repetition (rhetorical device) , design for testing , property (philosophy) , parallel computing , computer engineering , reliability engineering , electronic circuit , engineering , paleontology , linguistics , philosophy , electrical engineering , epistemology , seismology , biology , geology