Open AccessPower quality event classification: an overview and key issues
Author(s) -
D. Saxena,
Kiran Verma,
S. N. Singh
Publication year - 2010
Publication title -
international journal of engineering science and technology
Language(s) - English
Resource type - Journals
ISSN - 2141-2839
DOI - 10.4314/ijest.v2i3.59190
Subject(s) - key (lock) , computer science , power quality , event (particle physics) , reliability engineering , quality (philosophy) , artificial intelligence , noise (video) , microprocessor , machine learning , data mining , engineering , computer security , electrical engineering , embedded system , voltage , philosophy , physics , epistemology , quantum mechanics , image (mathematics)
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