Open AccessCorrelation between the Annealing Effect and the Electrical Characteristics of the Depletion Region in ZnO, SnO2and ZTO Films
Author(s) -
Teresa Oh
Publication year - 2016
Publication title -
transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2016.17.2.104
Subject(s) - materials science , annealing (glass) , amorphous solid , ohmic contact , x ray photoelectron spectroscopy , electrical resistivity and conductivity , schottky diode , schottky barrier , semiconductor , analytical chemistry (journal) , crystallography , nanotechnology , chemical engineering , metallurgy , optoelectronics , chemistry , electrical engineering , layer (electronics) , diode , chromatography , engineering
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