Open AccessForward Current Transport Mechanism of Cu Schottky Barrier Formed on n-type Ge Wafer
Author(s) -
Se Hyun Kim,
Chan Yeong Jung,
Hogyoung Kim,
Yunae Cho,
Dong Wook Kim
Publication year - 2015
Publication title -
transactions on electrical and electronic materials/transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2015.16.3.151
Subject(s) - thermionic emission , materials science , schottky diode , schottky barrier , analytical chemistry (journal) , condensed matter physics , wafer , physics , nanotechnology , optoelectronics , diode , chemistry , nuclear physics , electron , chromatography