Open AccessThe Electrical Characterization and Relaxation Behavior of Ag(Ta0.8Nb0.2)O3Ceramics
Author(s) -
YoungSung Kim,
JaeChul Kim,
Tae-Hoon Jeong,
Sung-Pill Nam,
Seunghwan Lee,
Hongki Kim,
Ku-Tak Lee
Publication year - 2014
Publication title -
transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2014.15.2.100
Subject(s) - materials science , dissipation factor , dielectric , relaxation (psychology) , ceramic , capacitor , characterization (materials science) , permittivity , diffraction , high κ dielectric , condensed matter physics , engineering physics , optoelectronics , nanotechnology , voltage , composite material , electrical engineering , optics , psychology , social psychology , physics , engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom