Open AccessSurface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Author(s) -
Bok-Hee Youn,
Chung-Ryul Park,
Nam-Ryul Kim,
Youngkyun Seo,
Chul Huh,
Ki-Taek Lee
Publication year - 2002
Publication title -
transactions on electrical and electronic materials/transactions on electrical and electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.201
H-Index - 18
eISSN - 2092-7592
pISSN - 1229-7607
DOI - 10.4313/teem.2002.3.4.010
Subject(s) - x ray photoelectron spectroscopy , materials science , analytical chemistry (journal) , plasma , electrical resistivity and conductivity , polydimethylsiloxane , activation energy , surface layer , surface conductivity , layer (electronics) , nuclear magnetic resonance , composite material , chemistry , electrical engineering , chromatography , physics , quantum mechanics , engineering