
Current Characteristics in the Silicon Oxides
Author(s) -
Chang Soo Kang,
Jae Hak Lee
Publication year - 2016
Publication title -
jeon'gi jeonja jaeryo haghoe nonmunji/jeon-gi jeonja jaeryo hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2016.29.10.595
Subject(s) - materials science , oxide , silicon , stress (linguistics) , voltage , silc , leakage (economics) , optoelectronics , current (fluid) , gate oxide , electrical engineering , composite material , transistor , metallurgy , linguistics , philosophy , economics , macroeconomics , engineering