Open AccessCurrent Characteristics in the Silicon Oxides
Author(s) -
Changwoo Kang,
JaeHak Lee
Publication year - 2016
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2016.29.10.595
Subject(s) - materials science , oxide , silicon , stress (linguistics) , voltage , silc , leakage (economics) , optoelectronics , current (fluid) , gate oxide , electrical engineering , composite material , transistor , metallurgy , linguistics , philosophy , economics , macroeconomics , engineering
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