Open AccessA Study on Malfunction Mode and Failure Rate Properties of Semiconductor by Impact of Pulse Repetition Rate
Author(s) -
Ki-Hoon Park,
Jeong-Ju Bang,
Ruck-Woan Kim,
ChangSu Huh
Publication year - 2015
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2015.28.6.360
Subject(s) - pulse (music) , pulse generator , materials science , duty cycle , semiconductor , electromagnetic pulse , timer , pulse wave , pulse width modulation , pulse duration , optoelectronics , pulsed power , semiconductor device , electrical engineering , amplitude , rise time , voltage , optics , physics , laser , engineering , layer (electronics) , composite material , microcontroller
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