Open AccessCharacteristic of On-resistance Improvement with Gate Pad Structure
Author(s) -
Ye-Hwan Kang,
Won-Young Yoo,
Woo-Taek Kim,
Tae-Su Park,
Eun-Sik Jung,
Chang Heon Yang
Publication year - 2015
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2015.28.4.218
Subject(s) - materials science , composite material , electrical engineering , engineering
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