Open AccessSimulation Method of Temperature Dependent Threshold Voltage Shift in Metal Oxide Thin-film Transistors
Author(s) -
Seyong Kwon,
Taeho Jung
Publication year - 2015
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2015.28.3.154
Subject(s) - spice , threshold voltage , materials science , thin film transistor , reliability (semiconductor) , oxide , exponential function , transistor , optoelectronics , voltage , electronic engineering , electrical engineering , composite material , engineering , metallurgy , thermodynamics , mathematics , layer (electronics) , physics , mathematical analysis , power (physics)
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