Open AccessA Study on Properties of C-V Degradation due to Heating in Teflon
Author(s) -
Sung Ill Lee
Publication year - 2014
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2014.27.11.730
Subject(s) - degradation (telecommunications) , materials science , composite material , electrical engineering , engineering
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