Open AccessStructural, Optical, and Electrical Properties of In2O3Thin Films Deposited on Various Buffer Layers
Author(s) -
Moon-Hwan Kim
Publication year - 2012
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2012.25.7.491
Subject(s) - thin film , materials science , buffer (optical fiber) , electrical resistivity and conductivity , diffractometer , layer (electronics) , transmittance , sputtering , analytical chemistry (journal) , composite material , sputter deposition , optoelectronics , scanning electron microscope , nanotechnology , chemistry , electrical engineering , chromatography , engineering
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