Open AccessStudy on Design of 60 V TDMOSFET for Protection Circuit Module
Author(s) -
Hyunwoong Lee,
Eun-Sik Jung,
Reum Oh,
Man-Young Sung
Publication year - 2012
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2012.25.5.340
Subject(s) - voltage drop , electrical engineering , voltage , drop (telecommunication) , mosfet , breakdown voltage , materials science , power mosfet , engineering , electronic engineering , transistor
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